Moortec Semiconductor, specialists in Process, Voltage and Temperature (PVT) sensors, announce the availability of their Embedded Voltage Monitor on TSMC’s 16nm FF+ and FFC processes.
The Voltage Monitor provides the means for advanced node Integrated Circuit (IC) developers to accurately measure core supply domain voltages on 16nm digital MOS devices. The Voltage Monitor is specifically targeted to enable high performance Dynamic Voltage Scaling (DVS) schemes as well as provide a means for accurate IR drop analysis. The monitor is capable of monitoring multiple supply domains and can be used to generate low voltage alarms as well as providing real-time supply data.
Moortec Voltage Monitor on TSMC 16FF+ & FFC Moortec believes that in-chip monitoring has become a vital factor in the design and performance optimisation of small-geometry designs. Since 2010 Moortec have specialised in the development and delivery of highly featured embedded PVT sensors for use on-chip in advanced node CMOS technologies such as 28nm and 16nm.
Using such monitors embedded within SoC (System on Chip) designs allows for greater dynamic performance optimisation as sensing die temperature, detecting logic speed and monitoring voltage supply levels, can be used intelligently to vary system clock frequencies and the voltage levels of supply domains.
“As voltage supply levels are reduced with the emergence of FinFET processes, conditions for core logic to perform and meet timing in often noisy, complex digital architectures is challenging,” said Stephen Crosher, Managing Director of Moortec.
“To sustain the development of compelling products, designers are increasingly required to be aware of methods to achieve high performance. By monitoring supply accurately, optimisation schemes can be specifically applied to each and every device.”
For more information please visit www.moortec.com.
Call: Ramsay Allen on +44 1752 875133 or email [email protected]